发明名称 |
Semiconductor device and substrate with chalcogen doped region |
摘要 |
An undoped semiconductor substrate is doped by applying stress at a side of the undoped semiconductor substrate to release self interstitials in the substrate and implanting chalcogen atoms into the side of the substrate. The substrate is annealed to form a first semiconductor region containing the chalcogen atoms and a second semiconductor region devoid of the chalcogen atoms. The first semiconductor region has a doping concentration higher than the doping concentration of the second semiconductor region. The indiffusion of chalcogen atoms into a semiconductor material in the presence of self interstitials can also be used to form field stop regions in power semiconductor devices.
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申请公布号 |
US8361893(B2) |
申请公布日期 |
2013.01.29 |
申请号 |
US201113075475 |
申请日期 |
2011.03.30 |
申请人 |
INFINEON TECHNOLOGIES AG;SCHMIDT GERHARD;SCHULZE HANS-JOACHIM;KOLBESEN BERND |
发明人 |
SCHMIDT GERHARD;SCHULZE HANS-JOACHIM;KOLBESEN BERND |
分类号 |
H01L21/265 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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