发明名称 Surface texture measuring device, surface texture measuring method, and program
摘要 Surface texture measuring device includes: first pseudo measurement point sequence obtaining means which drives contact piece to trace a surface of reference workpiece having reference shape and obtains locus of certain position of the contact piece as first pseudo measurement point sequence; contact piece model calculating means which calculates, based on first pseudo measurement point sequence and design surface specifying the reference workpiece surface, a contact piece model representing surface shape of the contact piece and placed in pseudo space; second pseudo measurement point sequence obtaining means which places contact piece model such that its surface contacts a reference surface specifying a workpiece surface and it takes the same posture as contact piece in measurement, and calculates reference position of the contact piece model as second pseudo measurement point sequence; and replacement determination means which determines whether to replace contact piece based on second pseudo measurement point sequence.
申请公布号 US8364441(B2) 申请公布日期 2013.01.29
申请号 US20100662618 申请日期 2010.04.26
申请人 MITUTOYO CORPORATION;KOJIMA TSUKASA 发明人 KOJIMA TSUKASA
分类号 G06F17/40 主分类号 G06F17/40
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