发明名称 Bond interface testing
摘要 A method and apparatus for testing a bond interface is provided. An initial wave is transmitted into a first end of a first material. The first material is connected to a second material by an adhesive at a bond interface. The first material is dissimilar to the second material. The initial wave splits into a first wave and a second wave at the bond interface. Parameters are changed so a first wave travels through the first material to the first end of the first material and back to the bond interface in a first amount of time and the second wave travels through the second material to a second end of the second material and back to the bond interface in a second amount of time. The first amount of time is substantially equal to the second amount of time. A tension is obtained in the adhesive at the bond interface.
申请公布号 US8359924(B1) 申请公布日期 2013.01.29
申请号 US20100828519 申请日期 2010.07.01
申请人 THE BOEING COMPANY;BOSSI RICHARD HENRY;HOUSEN KEVIN R. 发明人 BOSSI RICHARD HENRY;HOUSEN KEVIN R.
分类号 G01N29/04 主分类号 G01N29/04
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