发明名称 |
Automated interferometric noise measurement |
摘要 |
In one embodiment, an automated interferometric noise measurement system includes: a signal source adapted to provide a carrier signal; a delay line adapted to delay a first version of the carrier signal to provide a delayed signal to a device-under-test (DUT); a variable attenuator adapted to attenuate a second version of the carrier signal to provide an attenuated signal; a first variable phase-shifter adapted to phase-shift the attenuated signal to provide a first phase-shifted signal; a hybrid coupler adapted to receive an output signal from the DUT and the first phase-shifted signal to provide a carrier-suppressed signal and a carrier-enhanced signal; a low-noise amplifier adapted to amplify the carrier-suppressed signal to provide an amplified signal; a second variable phase-shifter adapted to phase-shift a version of the carrier-enhanced signal to provide a second phase-shifted signal; a first mixer adapted to mix a first version of the amplified signal and the second phase-shifted signal to provide a first noise signal; and a controller adapted to control the variable attenuator, the first and second phase-shifters, and the low-noise amplifier responsive to a zero-crossing value in the first noise signal.
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申请公布号 |
US8363849(B2) |
申请公布日期 |
2013.01.29 |
申请号 |
US20060469472 |
申请日期 |
2006.08.31 |
申请人 |
OMNIPHASE RESEARCH LABORATORIES, INC.;RZYSKI EUGENE;WANGSNESS TODD |
发明人 |
RZYSKI EUGENE;WANGSNESS TODD |
分类号 |
H04B15/00 |
主分类号 |
H04B15/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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