发明名称 Surface inspection apparatus
摘要 A surface inspection apparatus for observing an edge portion of an object to be inspected includes an illumination device that irradiates an illumination light to the edge portion; and an observation device that forms an image of an observation region of the edge portion illuminated with the illumination light. The illumination device emits a first irradiation beam and a second irradiation beam as the illumination light. The first irradiation beam is incident at approximately right angles to the edge portion for compensating brightness of the image and the second irradiation beam is obliquely incident laterally to the observation region of the edge portion for generating a shadow depending on a surface state of the observation region.
申请公布号 US8363214(B2) 申请公布日期 2013.01.29
申请号 US201113269268 申请日期 2011.10.07
申请人 NIKON CORPORATION;WATANABE TAKASHI 发明人 WATANABE TAKASHI
分类号 G01N21/00 主分类号 G01N21/00
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