Test method of integrated circuit with random-number generation circuit and integrated circuit with random-number generation circuit

摘要

Random numbers output from a random-number generation circuit, for which an optimized control parameter is set, at a predetermined timing after power-on reset are obtained after each power-on reset, by repeating the power-on reset with respect to a system LSI for a preset number of times, and a test of the obtained predetermined number of random numbers is performed by using a test circuit incorporated in the system LSI to determine the quality of the random-number generation circuit incorporated in the system LSI.