发明名称 IMPROVED BONDING SURFACES FOR DIRECT BONDING OF SEMICONDUCTOR STRUCTURES
摘要 PURPOSE: Improved bonding surfaces for directly bonding semiconductor structures are provided to easily bond a device structure of a first semiconductor structure to a device structure of a second semiconductor structure with a conductive material-conductive material direct bonding process. CONSTITUTION: A device layer(101) includes a vertically extended conductive via and a horizontally extended conductive trace. A device structure(106) includes conductive metal arranged in a concave part. A surface of the device structure is exposed through dielectric materials(102). Additional dielectric materials are provided to a surface(103) of the dielectric materials. An exposed main surface(114) of the additional dielectric materials is planarized to form another semiconductor structure(120).
申请公布号 KR20130010443(A) 申请公布日期 2013.01.28
申请号 KR20120078214 申请日期 2012.07.18
申请人 SOITEC 发明人 SADAKA MARIAM
分类号 H01L21/60;H01L23/48 主分类号 H01L21/60
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