CYTOMETRIC PROCESS FOR COMPARATIVE ANALYSIS OF PCR PRODUCTS LENGTHS AND THE USE OF THIS PROCESS,申请号HU20080000760-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	CYTOMETRIC PROCESS FOR COMPARATIVE ANALYSIS OF PCR PRODUCTS LENGTHS AND THE USE OF THIS PROCESS
摘要
申请公布号	HU228175(B1)	申请公布日期	2013.01.28
申请号	HU20080000760	申请日期	2008.12.15
申请人	DEBRECENI EGYETEM	发明人	SZABO GABOR DR;IMRE LASZLO
分类号	C12Q1/68	主分类号	C12Q1/68
代理机构		代理人
主权项
地址

您可能感兴趣的专利

PROSTATE SPECIFIC PROTEINS EXPRESSED IN CANCER AND METHODS OF USE THEREOF

AUTONOMIC WIRELESS PRESENCE PING

MEASUREMENT, COMPENSATION AND CONTROL OF EQUIVALENT SHEAR RATE IN ACOUSTIC WAVE SENSORS

STRIPING AND CLIPPING CORRECTION

WAFER WITH OPTICAL CONTROL MODULES IN EXPOSURE FIELDS

IL-7 FUSION PROTEINS

WUSCHEL (WUS) GENE HOMOLOGS

INTEGRATED GLASS CERAMIC SYSTEMS

IMPROVED METAL STRIP ELECTROPLATING

HOXD3, HOXA3, AND HOXB3 COMPOSITIONS AND METHODS FOR IMPROVED WOUND HEALING

REMOVABLE/REUSABLE CLOSURE FOR CONTAINERS

MAGNETIC FUEL TREATMENT DEVICE

METHOD OF PRODUCING AN INDIVIDUAL IGNITION COIL AND COIL THUS OBTAINED

WRITE-ONCE OPTICAL DISC AND METHOD FOR RECORDING MANAGEMENT INFORMATION THEREON

OMEGA INTERFERON FOR THE TREATMENT OF HIV/AIDS, CANCER AND HUMAN AND VETERINARY ASTHMA

COMPETITION ASSAY FOR IDENTIFYING MODULATORS OF QUADRUPLEX NUCLEIC ACIDS

APPARATUS AND METHOD FOR HIGH SPEED SCAN FOR DETECTION AND MEASUREMENT OF PROPERTIES OF SUB-WAVELENGTH DEFECTS AND ARTIFACTS IN SEMICONDUCTOR AND MASK METROLOGY

USE OF GENE NCSAG4 FOR THE DIAGNOSIS AND PREVENTION OF NEOSPOROSIS AND AS A MARKER FOR ANALYSIS OF THE PATHOGENESIS

QUEUED LOCKS USING MONITOR-MEMORY WAIT