发明名称 METHOD FOR MEASUREMENT OF HEAT RESISTANCE OF SECTIONS OF LIGHT-EMITTING DIODE STRUCTURE
摘要 A method for the determination of thermal parameters of sections of light-emitting diode (LED) structure consists in measurement of dependence of temperature of p-n transition of LED T on time t after switch on of LED structure, measurement of power that is consumed by LED structure Pand determination of experimental values Rof thermal resistance and time constants Tfor each link of the structure, where i – number of link, besides that, one additionally measures the dependence of power P, emitted by LED structure on temperature, with determination of coefficient of power effectiveness of light-emitting diode structure &eegr;(T) = P/Pon temperature and experimental dependence of heat resistance of LED structure on time by formulawhere T– temperature of the p-&eegr; junction at given time instant, T– temperature at initial time instant, those are determined by the dependence T(t), after that one calculates theoretical dependence of thermal resistance of the LED structure R(t) by formulaand through approximation of the dependence R(t) with dependence R(t) the experimental values Rand τis determined.
申请公布号 UA76966(U) 申请公布日期 2013.01.25
申请号 UA20120007710U 申请日期 2012.06.25
申请人 V. LASHKARIOV SEMICONDUCTOR PHYSICS INSTITUTE OF THE NATIONAL ACADEMY OF SCIENCIS OF UKRAINE 发明人 BIELIAIEV OLEKSANDR YEVHENOVYCH;SOROKIN VIKTOR MYKHAILOVYCH;KONAKOVA RAISA VASYLIVNA;KUDRIK YAROSLAV YAROSLAVOVYCH;SHEREMET VOLODYMYR MYKOLAIOVYCH;SHYNKARENKO VOLODYMYR VIKTOROVYCH
分类号 主分类号
代理机构 代理人
主权项
地址