| 摘要 |
<P>PROBLEM TO BE SOLVED: To measure optical characteristics of an optical film without stopping the optical film, with high accuracy. <P>SOLUTION: A device for measuring optical characteristics comprises: a light projection part 12 for irradiating an optical film 11 with circularly polarized light as measurement light; a light receiving part 13 that has a plurality of kinds of wavelength plates arrayed in a Y direction and an imaging device in which a plurality of unit light-receiving areas, provided with coupled pixels becoming a unit for obtaining one measurement value so as to correspond to each of the wavelength plates, are arrayed in a X direction and that receives the measurement light having transmitted through the optical film 11 in a plurality of kinds of polarization states for every unit light-receiving area; a conveyance roller 14 for moving a unit measurement area by conveying the optical film 11 in the X direction; and a control part 16 for calculating a Mueller matrix of the unit measurement area from a plurality of measurement values obtained regarding the same unit measurement area by receiving the measurement light in a plurality of unit light-receiving areas while moving the unit measurement area, and for calculating optical characteristics using calculated elements of the Mueller matrix. <P>COPYRIGHT: (C)2013,JPO&INPIT |
