发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p>A method for manufacturing an MOSFET (1) is provided with: a step of introducing an impurity into a silicon carbide layer (10); a step of forming a carbon layer (81) on a surface layer portion of the silicon carbide layer (10) by selectively removing silicon from the surface layer portion, said silicon carbide layer having the impurity introduced therein; and a step of activating the impurity by heating the silicon carbide layer (10) having the carbon layer (81) formed thereon.</p>
申请公布号 WO2013011740(A1) 申请公布日期 2013.01.24
申请号 WO2012JP63476 申请日期 2012.05.25
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD.;NATIONAL UNIVERSITY CORPORATION NARA INSTITUTE OFSCIENCE AND TECHNOLOGY;MASUDA, TAKEYOSHI;HATAYAMA, TOMOAKI 发明人 MASUDA, TAKEYOSHI;HATAYAMA, TOMOAKI
分类号 H01L21/265;H01L21/336;H01L29/12;H01L29/78 主分类号 H01L21/265
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