发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
<p>A method for manufacturing an MOSFET (1) is provided with: a step of introducing an impurity into a silicon carbide layer (10); a step of forming a carbon layer (81) on a surface layer portion of the silicon carbide layer (10) by selectively removing silicon from the surface layer portion, said silicon carbide layer having the impurity introduced therein; and a step of activating the impurity by heating the silicon carbide layer (10) having the carbon layer (81) formed thereon.</p> |
申请公布号 |
WO2013011740(A1) |
申请公布日期 |
2013.01.24 |
申请号 |
WO2012JP63476 |
申请日期 |
2012.05.25 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES, LTD.;NATIONAL UNIVERSITY CORPORATION NARA INSTITUTE OFSCIENCE AND TECHNOLOGY;MASUDA, TAKEYOSHI;HATAYAMA, TOMOAKI |
发明人 |
MASUDA, TAKEYOSHI;HATAYAMA, TOMOAKI |
分类号 |
H01L21/265;H01L21/336;H01L29/12;H01L29/78 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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