发明名称 STRUCTURE AND METHOD FOR SINGLE GATE NON-VOLATILE MEMORY DEVICE
摘要 The present disclosure provides an integrated circuit. The integrated circuit includes a semiconductor substrate having a periphery region and a memory region; a field effect transistor disposed in the periphery region and having silicide features; and a single floating gate non-volatile memory device disposed in the memory region, free of silicide and having a first gate electrode and a second gate electrode laterally spaced from each other.
申请公布号 US2013020623(A1) 申请公布日期 2013.01.24
申请号 US201113184823 申请日期 2011.07.18
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.;TSUI YING-KIT;TSENG HUANG-WEN 发明人 TSUI YING-KIT;TSENG HUANG-WEN
分类号 H01L27/06;H01L21/336 主分类号 H01L27/06
代理机构 代理人
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