发明名称 FORMATION RESISTIVITY IMAGER WITH REDUCED LEAKAGE TO MANDREL
摘要 A method of estimating a parameter of a formation contacting a borehole with an instrument that includes a mandrel and a pad includes providing a measurement voltage to the pad; applying a biasing voltage to the mandrel while the measurement voltage is applied to the pad; measuring a received current during at least a portion of time the measurement voltage is provided; and estimating the parameter based on the received current.
申请公布号 WO2012149006(A3) 申请公布日期 2013.01.24
申请号 WO2012US34975 申请日期 2012.04.25
申请人 BAKER HUGHES INCORPORATED;BESPALOV, ALEXANDRE N.;ITSKOVICH, GREGORY B.;FORGANG, STANISLAV W. 发明人 BESPALOV, ALEXANDRE N.;ITSKOVICH, GREGORY B.;FORGANG, STANISLAV W.
分类号 G01V3/20;G01N27/02;G01N33/24 主分类号 G01V3/20
代理机构 代理人
主权项
地址