发明名称 CAPACITOR INSPECTION DEVICE AND INSPECTION METHOD OF THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To enable contact check, charging check, and insulation resistance check to be positively conducted, even with an extremely simple structure. <P>SOLUTION: After charging a capacitor C at a specified voltage at a charging step, in an inspection step, with a predetermined DC voltage applied to the capacitor C by a DC power source E via a pair of probes P, the current value (leak current) of the current running through the capacitor C is measured using an ammeter 11 to inspect whether the capacitor is good or bad. In this inspection, a voltmeter 12 is connected between the pair of probes P and a switch 13 is provided on the DC power source E, and then by turning the switch 13 off, contact check and charging check are conducted via the voltage measurement value measured by the voltmeter 12. If both checks produce good results, insulation resistance check is conducted by turning on the switch 13. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013015356(A) 申请公布日期 2013.01.24
申请号 JP20110147084 申请日期 2011.07.01
申请人 HIOKI EE CORP 发明人 WAKAMATSU HIDEAKI;SAKAI KENJI
分类号 G01R31/00;H01G13/00 主分类号 G01R31/00
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