发明名称 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION, METHOD OF PRODUCING RESIST PATTERN, SEMICONDUCTOR DEVICE AND ELECTRONIC DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a positive photosensitive resin composition that can be cured at low temperature, can be developed with an aqueous alkali solution, has sufficiently high sensitivity and resolution and can form resist patterns with excellent adhesiveness and thermal shock resistance, as well as a method of producing a resist pattern using the positive photosensitive resin composition, a semiconductor device having a resist pattern formed by the method, and an electronic device comprising the semiconductor device. <P>SOLUTION: The positive photosensitive resin composition contains an alkali-soluble resin having a phenolic hydroxyl group, a compound which generates an acid due to light, a heat-crosslinking agent, and an acrylic resin including a C4-C20 alkyl (meth)acrylate unit, a (meth)acrylic acid unit and a (meth)acrylate unit having a primary, secondary or tertiary amino group in a side chain. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013015856(A) 申请公布日期 2013.01.24
申请号 JP20120197664 申请日期 2012.09.07
申请人 HITACHI CHEM CO LTD 发明人 MATSUTANI HIROSHI;UENO TAKUMI;NICOLAS ALEXANDRE;YAMASHITA YUKIHIKO;NANAUMI KEN;TANIMOTO AKITOSHI
分类号 G03F7/023;C08F220/06;C08F220/18;C08F220/34;C08G8/30;G03F7/004;G03F7/40 主分类号 G03F7/023
代理机构 代理人
主权项
地址