发明名称 ELECTRON MICROSCOPE
摘要 <p>Provided is an electron microscope on which can be mounted a high-voltage application specimen holder that takes into account operability while providing safety (a shock prevention mechanism). The present invention is characterized by being equipped with a specimen holder having a function whereby voltage is applied to a specimen stand on which a specimen is loaded, a voltage source that supplies the voltage applied to the specimen stand, and a voltage cable one end of which is connected to the specimen holder, with a relay device to which the other end of the voltage cable is connected being installed on a mount that supports the lens tube of the electron microscope.</p>
申请公布号 WO2013011612(A1) 申请公布日期 2013.01.24
申请号 WO2012JP03177 申请日期 2012.05.16
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION;OGASHIWA, TAKESHI;AKATSU, MASAHIRO 发明人 OGASHIWA, TAKESHI;AKATSU, MASAHIRO
分类号 H01J37/20;H01J37/28 主分类号 H01J37/20
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