发明名称 NOVEL CMOS IMAGE SENSOR STRUCTURE
摘要 Provided is a method of fabricating an image sensor device. The method includes providing a first substrate having a radiation-sensing region disposed therein. The method includes providing a second substrate having a hydrogen implant layer, the hydrogen implant layer dividing the second substrate into a first portion and a second portion. The method includes bonding the first portion of the second substrate to the first substrate. The method includes after the bonding, removing the second portion of the second substrate. The method includes after the removing, forming one or more microelectronic devices in the first portion of the second substrate. The method includes forming an interconnect structure over the first portion of the second substrate, the interconnect structure containing interconnect features that are electrically coupled to the microelectronic devices.
申请公布号 US2013020662(A1) 申请公布日期 2013.01.24
申请号 US201113185204 申请日期 2011.07.18
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.;KAO MIN-FENG;YAUNG DUN-NIAN;LIU JEN-CHENG;CHUANG CHUN-CHIEH;WANG WEN-DE 发明人 KAO MIN-FENG;YAUNG DUN-NIAN;LIU JEN-CHENG;CHUANG CHUN-CHIEH;WANG WEN-DE
分类号 H01L31/02 主分类号 H01L31/02
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