发明名称 TUNNEL MAGNETORESISTANCE EFFECT ELEMENT, AND MAGNETIC MEMORY CELL AND RANDOM ACCESS MEMORY INCLUDING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a high-speed and ultra-low power consumption nonvolatile memory having high thermal stability. <P>SOLUTION: In a nonvolatile magnetic memory, a high-output tunnel magnetoresistance effect element in which a free layer having high thermal stability is applied is provided, and a writing method by a spin-transfer torque is applied. The tunnel magnetoresistance effect element 1 includes a free layer comprising a first ferromagnetic film 306 and a second ferromagnetic film 308, which have a body-centered cubic structure containing Co, Fe and B, and a first nonmagnetic film 307, and has a structure in which a fixed layer 3021 is stacked via an MgO insulating film 305 having a rock-salt structure (100)-oriented to the free layer. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013016820(A) 申请公布日期 2013.01.24
申请号 JP20120181778 申请日期 2012.08.20
申请人 HITACHI LTD;TOHOKU UNIV 发明人 ONO HIDEO;IKEDA SHOJI;RI EIMIN;HAYAKAWA JUN
分类号 H01L21/8246;H01F10/32;H01L27/105;H01L29/82;H01L43/08;H01L43/10 主分类号 H01L21/8246
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