发明名称 APPARATUS AND TECHNIQUES OF NON-INVASIVE ANALYSIS
摘要 Apparatus and methods, which comprise examination of an abnormality on a subject using a temperature stimulus applied to the subject, provide a non-invasive analysis technique. In an embodiment, a non-invasive infrared imaging technique can be used to observe the temporal response of a lesion to temperature stimuli to form a basis for evaluating the abnormality. A technique including applying temperature stimuli and detecting responses to the applied temperature stimuli provide a non-invasive technique that can be used to identify an abnormality on a subject and/or characteristics of the abnormality. In an embodiment, a non-invasive transient infrared imaging technique can be used to observe the temporal response of a lesion to temperature stimuli to form a basis for determining characteristics correlated to the lesion. Additional apparatus, systems, and methods are disclosed.
申请公布号 US2013023773(A1) 申请公布日期 2013.01.24
申请号 US201113639818 申请日期 2011.04.07
申请人 STC. UNM;KRISHNA SANJAY;KRISHNA SANCHITA 发明人 KRISHNA SANJAY;KRISHNA SANCHITA
分类号 A61B6/00 主分类号 A61B6/00
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