发明名称 PROJECTION ILLUMINATION METHOD, PROJECTION ILLUMINATION SYSTEM, LASER BEAM SOURCE AND BANDWIDTH NARROWING MODULE FOR A LASER BEAM SOURCE
摘要 <p>In a projection exposure method for the exposure of a radiation-sensitive substrate arranged in the region of an image surface of a projection objective with at least one image of a pattern of a mask arranged in the region of an object surface of the projection objective, laser radiation having a spectral intensity distribution I(ω) dependent on the angular frequencyωis used. The laser radiation is characterized by an aberration parameterαin accordance with:α:=∫I ⁡ (ω) ⁢ ω2 ⁢ ⅆ ω∫I ⁡ (ω) ⁢ ⅆ ωand a coherence timeτin accordance with:τ=∫I ⁡ (ω) 2 ⁢ ⅆ ω[∫I ⁡ (ω) ⁢ ⅆ ω] 2 The laser radiation is introduced into an illumination system for generating an illumination radiation directed onto the mask, and the pattern is imaged onto the substrate with the aid of a projection objective. The spectral intensity distribution is set so thatατ2≰0.3. The influence of temporally varying speckles on image generation can be reduced by comparison with conventional methods, without simultaneously increasing the influence of chromatic aberrations on image generation.</p>
申请公布号 EP2399170(B1) 申请公布日期 2013.01.23
申请号 EP20100703169 申请日期 2010.02.04
申请人 CARL ZEISS SMT GMBH 发明人 PATRA, MICHAEL
分类号 G03F7/20;G02B27/48;H01S3/225 主分类号 G03F7/20
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