发明名称 |
APPARATUS FOR HEAT-TREATING SUBSTRATE |
摘要 |
PROBLEM TO BE SOLVED: To provide an apparatus for cooling a heat-treated substrate to a low temperature in a short time in a state of being held in a heat treat furnace of an atmosphere with controlled concentration. SOLUTION: A cooling plate 34 is provided for cooling the heat-treated wafer W in the heat treat furnace 22 maintained in a prescribed gas concentration atmosphere.
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申请公布号 |
JP2002203803(A) |
申请公布日期 |
2002.07.19 |
申请号 |
JP20000399942 |
申请日期 |
2000.12.28 |
申请人 |
DAINIPPON SCREEN MFG CO LTD |
发明人 |
HASHIZUME AKIO |
分类号 |
B25J15/00;B25J15/08;B65G49/07;H01L21/205;H01L21/26;H01L21/28;(IPC1-7):H01L21/26 |
主分类号 |
B25J15/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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