发明名称 WAFER SUPPORTING DEVICE AND MANUFACTURING METHOD THEREOF AND SEMICONDUCTOR-PROCESSING APPARATUS
摘要 PURPOSE: A wafer support device, a manufacturing method thereof, and a semiconductor processing apparatus are provided to improve the uniformity of a film property and a film thickness by reducing the number of particles attached to the rear of a wafer in a film forming process. CONSTITUTION: A protrusion part is arranged on a diameter line(2A-2A) on a base surface and is uniformly arranged on the region of the base surface. A first protrusion part(11) is composed of ceramic balls buried in the base surface. The ceramic ball is buried in the base surface by caulking. A second protrusion part is made of the same materials as the materials of the base surface.
申请公布号 KR20130009688(A) 申请公布日期 2013.01.23
申请号 KR20120076564 申请日期 2012.07.13
申请人 ASM JAPAN K.K. 发明人 FUMITAKA SHOJI;HIDEAKI FUKUDA
分类号 H01L21/683;C23C16/458;H01L21/205 主分类号 H01L21/683
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