发明名称 |
WAFER SUPPORTING DEVICE AND MANUFACTURING METHOD THEREOF AND SEMICONDUCTOR-PROCESSING APPARATUS |
摘要 |
PURPOSE: A wafer support device, a manufacturing method thereof, and a semiconductor processing apparatus are provided to improve the uniformity of a film property and a film thickness by reducing the number of particles attached to the rear of a wafer in a film forming process. CONSTITUTION: A protrusion part is arranged on a diameter line(2A-2A) on a base surface and is uniformly arranged on the region of the base surface. A first protrusion part(11) is composed of ceramic balls buried in the base surface. The ceramic ball is buried in the base surface by caulking. A second protrusion part is made of the same materials as the materials of the base surface.
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申请公布号 |
KR20130009688(A) |
申请公布日期 |
2013.01.23 |
申请号 |
KR20120076564 |
申请日期 |
2012.07.13 |
申请人 |
ASM JAPAN K.K. |
发明人 |
FUMITAKA SHOJI;HIDEAKI FUKUDA |
分类号 |
H01L21/683;C23C16/458;H01L21/205 |
主分类号 |
H01L21/683 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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