发明名称 Nonvolatile memory device and method with multiple verification pass voltages
摘要 A nonvolatile memory device includes an operation voltage generation unit configured to generate a first pass voltage when a verification voltage is higher than a reference voltage and to generate a second pass voltage lower than the first pass voltage when the verification voltage is lower than the reference voltage.
申请公布号 US8358536(B2) 申请公布日期 2013.01.22
申请号 US20100763539 申请日期 2010.04.20
申请人 HYNIX SEMICONDUCTOR INC.;WANG IN SOO 发明人 WANG IN SOO
分类号 G11C11/34;G11C16/04 主分类号 G11C11/34
代理机构 代理人
主权项
地址