发明名称 Spectrometer for identifying analyte materials
摘要 A spectrometer for identifying an analyte material. One embodiment of the spectrometer includes a single ultrashort pulsed laser (USPL) source, a fiber interferometer, a frequency converter and a transceiver. The USPL source is configured to generate a laser beam. The interferometer is operatively coupled to the USPL source, and is configured to split the laser beam into a first laser beam and a second laser beam, providing a variable difference in lengths between the paths of the first laser beam and the second laser beam. The spectrometer then electronically scans the variable-path second laser beam over the first laser beam to generate interferogram patterns. The frequency converter is configured to receive the interferogram patterns from the interferometer, and perform a frequency conversion of the interferogram patterns to form an output beam. The transceiver is configured to transmit the output beam and to receive radiation from the analyte material. The radiation is thereafter used to identify the analyte material.
申请公布号 US8358420(B1) 申请公布日期 2013.01.22
申请号 US20100660403 申请日期 2010.02.26
申请人 SYSTEM PLANNING CORPORATION;DEWITT KRISTIN MARIE;DEWITT MERRICK JOSEPH 发明人 DEWITT KRISTIN MARIE;DEWITT MERRICK JOSEPH
分类号 G01B9/02 主分类号 G01B9/02
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