| 摘要 |
Compensation is performed for initial nonuniformity or aging of drive transistors and electroluminescent (EL) emitters in 3T1C EL subpixels of an EL display, such as an organic light-emitting diode (OLED) display. A readout transistor connected to the EL emitter is used to readout the voltage of the emitter and compensation for &Dgr;Vth, &Dgr;VEL, and OLED efficiency loss is performed using a model. Measurements are taken during a frame by driving a target subpixel at a higher luminance for a shorter time, then using the remaining time in the frame to measure. Measurements can be taken with an A/D converter or with a ramp generator and comparator. Compensation is performed for each subpixel individually.
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