发明名称 METHOD OF MANUFACTURING A PHASE CHANGE MEMORY DEVICE
摘要 <p>PURPOSE: A method for manufacturing a phase change memory device is provided to prevent the generation of an oxide film by performing a reflow process. CONSTITUTION: An opening(115) is formed in an interlayer insulating film(110). The opening is buried to form a phase change material layer. A plasma process is performed on the phase change material layer. And then, an oxide film is removed on the surface of the change material layer. A thermal process is performed on the phase change material layer.</p>
申请公布号 KR20130007759(A) 申请公布日期 2013.01.21
申请号 KR20110068279 申请日期 2011.07.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, JEONG HEE;PARK, SOON OH;PARK, JUNG HWAN;OH, JIN HO
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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