发明名称 SEMICONDUCTOR DEVICE AND TESTING METHOD THEREOF
摘要 <p>A semiconductor device is disclosed. The semiconductor device includes a switching signal generating circuit formed of a PMOS transistor, a resistor, and inverters which outputs an internal switching signal for switching an operating mode between a first operating mode and a second operating mode when an operating state satisfies a predetermined condition, a mode selection pad to which an external switching signal capable of selecting the first operating mode is input in priority to the internal switching signal, and a switching circuit formed of an OR circuit which switches the operating mode between the first operating mode and the second operating mode based on the external switching signal or the internal switching signal. An output from the switching signal generating circuit is input to the mode selection pad via a trimming fuse.</p>
申请公布号 KR101224251(B1) 申请公布日期 2013.01.21
申请号 KR20107014900 申请日期 2008.12.25
申请人 发明人
分类号 G01R31/28;H01L21/82;H01L27/04 主分类号 G01R31/28
代理机构 代理人
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