发明名称 Fabrication Method Of Phase Change Random Access Memory Apparatus
摘要 PURPOSE: A method for manufacturing a phase change memory device is provided to form a phase change material pattern with a vertical profile by repeating a treatment process to etch phase change materials and remove metallic byproducts. CONSTITUTION: Phase change materials and conductive materials are successively laminated on a semiconductor substrate(110). A switching device and a heating electrode pattern(145) are formed on the semiconductor substrate. The phase change materials and the conductive materials are removed with a predetermined height several times. A phase change material pattern(155) is formed on a diode and the heating electrode pattern. Etching materials are used by combining Cl2, CxHy, CxHyFz, CFx, BCL3, N2, or Ar gases.
申请公布号 KR101212775(B1) 申请公布日期 2013.01.21
申请号 KR20110017087 申请日期 2011.02.25
申请人 发明人
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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