发明名称 |
METHOD FOR FORMING SiX-BASED FILM |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a technology capable of effectively suppressing the occurrence of particles of a Si system unreacted intermediate when forming a silicon nitride system film. <P>SOLUTION: The method for forming the SiX system film by plasma CVD method comprises an X-based plasma producing step for producing the plasma by supplying the X-based gas, and an Si-based plasma producing step for producing a plasma by firstly supplying the Si-based gas after producing the X-based plasma by the X-based plasma producing step. <P>COPYRIGHT: (C)2007,JPO&INPIT</p> |
申请公布号 |
JP2007242957(A) |
申请公布日期 |
2007.09.20 |
申请号 |
JP20060064448 |
申请日期 |
2006.03.09 |
申请人 |
CONSORTIUM FOR ADVANCED SEMICONDUCTOR MATERIALS &RELATED TECHNOLOGIES |
发明人 |
KOGA KAZUHIRO;OKOCHI KAZUHIRO;HASEBE TADAYOSHI |
分类号 |
H01L21/318;H01L21/768;H01L23/522 |
主分类号 |
H01L21/318 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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