发明名称 SUBSTRATE INSPECTION APPARATUS AND OLED MANUFACTURING APPARATUS COMPRISING THE SAME
摘要 PURPOSE: A substrate inspecting device and an OLED manufacturing apparatus including the same are provided to improve the yield of a panel process by simply repairing defects through a repair chamber. CONSTITUTION: A vacuum chamber(513) vacuumizes an inspection chamber(504) by exhausting the inspection chamber of air. An inspection unit inspects a substrate inputted to the vacuum chamber and includes a first inspection unit(509), a second inspection unit(510), and a control unit. The first inspection unit firstly inspects the surface of the substrate. The second inspection unit precisely inspects the defective part determined by the first inspection unit. An air conditioning unit(514) raises or lowers the temperature of the inspection chamber.
申请公布号 KR20130007225(A) 申请公布日期 2013.01.18
申请号 KR20110064556 申请日期 2011.06.30
申请人 LIGADP CO., LTD. 发明人 CHOI, SANG JIN
分类号 H01L51/56;G01N21/88;H01L21/66 主分类号 H01L51/56
代理机构 代理人
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