发明名称 |
ETCHING METHOD AND DEVICES PRODUCED USING THE ETCHING METHOD |
摘要 |
A double ITO structure, containing sequential layers of indium tin oxide (ITO), silicon dioxide (SiO2) (which may include a dopant material) and ITO, is selectively protected by a patterned photo-resist mask. The sequential layers are etched together in a single etching step using an etchant composition which is an acidic solution containing a transition metal chloride and hydrochloric acid (HCl). Thus, the double ITO structure is etched using a substantially fluoride-free etchant composition. |
申请公布号 |
WO2013010067(A2) |
申请公布日期 |
2013.01.17 |
申请号 |
WO2012US46640 |
申请日期 |
2012.07.13 |
申请人 |
3M INNOVATIVE PROPERTIES COMPANY;SEBASTIAN, MUTHU;TAN, FONG, LIANG |
发明人 |
SEBASTIAN, MUTHU;TAN, FONG, LIANG |
分类号 |
H01L21/306 |
主分类号 |
H01L21/306 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|