发明名称 ETCHING METHOD AND DEVICES PRODUCED USING THE ETCHING METHOD
摘要 A double ITO structure, containing sequential layers of indium tin oxide (ITO), silicon dioxide (SiO2) (which may include a dopant material) and ITO, is selectively protected by a patterned photo-resist mask. The sequential layers are etched together in a single etching step using an etchant composition which is an acidic solution containing a transition metal chloride and hydrochloric acid (HCl). Thus, the double ITO structure is etched using a substantially fluoride-free etchant composition.
申请公布号 WO2013010067(A2) 申请公布日期 2013.01.17
申请号 WO2012US46640 申请日期 2012.07.13
申请人 3M INNOVATIVE PROPERTIES COMPANY;SEBASTIAN, MUTHU;TAN, FONG, LIANG 发明人 SEBASTIAN, MUTHU;TAN, FONG, LIANG
分类号 H01L21/306 主分类号 H01L21/306
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