发明名称 CAPACITIVE STRUCTURE OF SEMICONDUCTOR
摘要 <p>A capacitor structure of a semiconductor device is provided to prevent mismatching by rapidly supplying a current to each of layers. A plurality of first metal elements(110) are connected to a via(112) along a vertical direction. A plurality of second metal elements and the first metal elements are alternately arranged along a horizontal direction and are connected to a via along a vertical direction. A dielectric(130) is formed between the first and second metal elements. An extension(114) is extended from one end of each of the first metal elements. An extension(124) is extended from one end of each of the second metal elements. The extensions are connected to branch parts(210,220) for supplying current to each of layers and grounding each of layers.</p>
申请公布号 KR100800928(B1) 申请公布日期 2008.02.04
申请号 KR20060082705 申请日期 2006.08.30
申请人 DONGBU ELECTRONICS CO., LTD. 发明人 PARK, CHAN HO
分类号 H01L27/108 主分类号 H01L27/108
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