发明名称 METHOD OF FORMING A PHASE CHANGE MATERIAL LAYER PATTERN AND METHOD OF MANUFACTURING A PHASE CHANGE MEMORY DEVICE
摘要 A method of forming a phase change material layer pattern includes forming a phase change material layer partially filling an opening through an insulating interlayer. A plasma treatment process is performed on the phase change material layer to remove an oxide layer on a surface of the phase change material layer. A heat treatment process is performed on the phase change material layer to remove a void or a seam in the phase change material layer, sufficiently filling the opening.
申请公布号 US2013017663(A1) 申请公布日期 2013.01.17
申请号 US201213543905 申请日期 2012.07.09
申请人 SAMSUNG ELECTRONICS CO., LTD.;PARK JEONG-HEE;PARK SOON-OH;PARK JUNG-HWAN;OH JIN-HO 发明人 PARK JEONG-HEE;PARK SOON-OH;PARK JUNG-HWAN;OH JIN-HO
分类号 H01L47/00 主分类号 H01L47/00
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