发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device and a manufacturing method of the same, which can be simply manufactured without requiring alignment accuracy; ensure a wide contact area with a channel region; and develop characteristics such as a threshold voltage, as designed. <P>SOLUTION: A manufacturing method of a trench gate MOS transistor 1 comprises: forming a curved part 13 at an opening end of a gate trench 3 such that an opening width of the gate trench 3 grows wider in a trumpet shape; embedding an embedding insulation film 24 in the curved part 13; and forming a contact trench 4 in a self-alignment manner with respect to the curved part 13 of the gate trench 13 by etching an Si epitaxial layer 8 by using the embedding insulation film 24 as a mask. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013012647(A) 申请公布日期 2013.01.17
申请号 JP20110145406 申请日期 2011.06.30
申请人 ROHM CO LTD 发明人 OMORI KENGO
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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