发明名称 |
Prediction Of Circuit Performance Variations Due To Device Mismatch |
摘要 |
Aspects of the invention relate to techniques for predicting circuit performance variations due to device mismatch. Circuit simulation is performed to generate circuit simulation results based on a circuit description and information of circuit element parameters. Based on the simulation results, sensitivity information for the circuit design and current/charge deviations caused by individual circuit element parameter variations may be computed. Based on the sensitivity information and the current/charge deviations, steady-state mismatch effect information is determined. The determination may comprise first computing output parameter deviations caused by the individual variations of the circuit element parameters and then computing a total output parameter deviation based on the output parameter deviations.
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申请公布号 |
US2013018645(A1) |
申请公布日期 |
2013.01.17 |
申请号 |
US201213546962 |
申请日期 |
2012.07.11 |
申请人 |
MENTOR GRAPHICS CORPORATION;VEERSE FABRICE ALAIN ROBERT |
发明人 |
VEERSE FABRICE ALAIN ROBERT |
分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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