发明名称 |
ON-CHIP SIGNAL WAVEFORM MEASUREMENT CIRCUIT |
摘要 |
Methods and apparatus are provided for on-chip signal waveform measurement. An integrated circuit is provided that comprises an on-chip comparator for comparing a voltage level of a signal to be measured to a voltage level of a reference voltage, at a time determined by at least one edge of an evaluation clock. The reference voltage can be varied to obtain a plurality of voltage points. The evaluation clock can be varied to obtain a plurality of time sampling points. In addition, the reference voltage and the evaluation clock can both be varied to obtain a plurality of voltage-time sampling points constituting a waveform corresponding to the signal to be measured.
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申请公布号 |
US2013015837(A1) |
申请公布日期 |
2013.01.17 |
申请号 |
US201113182016 |
申请日期 |
2011.07.13 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION;JENKINS KEITH A.;WANG PETER Z. |
发明人 |
JENKINS KEITH A.;WANG PETER Z. |
分类号 |
G01R19/00 |
主分类号 |
G01R19/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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