发明名称 Local interconnect structure and method for a CMOS image sensor
摘要 A self-aligned silicide (salicide) process is used to form a local interconnect for a CMOS image sensor consistent with a conventional CMOS image sensor process flow. An oxide layer is deposited over the pixel array of the image sensor. Portions of the oxide layer is removed and a metal layer is deposited. The metal layer is annealed to form a metal silicide. Optionally, a protective oxide layer is then deposited.
申请公布号 US7345330(B2) 申请公布日期 2008.03.18
申请号 US20040007859 申请日期 2004.12.09
申请人 OMNIVISION TECHNOLOGIES, INC. 发明人 RHODES HOWARD E.
分类号 H01L31/062 主分类号 H01L31/062
代理机构 代理人
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