发明名称 |
Test Schemes and Apparatus for Passive Interposers |
摘要 |
A probe card includes a plurality of probe pins, and a switch network connected to the plurality of probe pins. The switch network is configured to connect the plurality of probe pins in a first pattern, and reconnect the plurality of probe pins in a second pattern different from the first pattern. |
申请公布号 |
US2013015872(A1) |
申请公布日期 |
2013.01.17 |
申请号 |
US201113184008 |
申请日期 |
2011.07.15 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.;LEE YUN-HAN;WANG MILL-JER;CHOU TAN-LI |
发明人 |
LEE YUN-HAN;WANG MILL-JER;CHOU TAN-LI |
分类号 |
G01R1/073;G01R31/20 |
主分类号 |
G01R1/073 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|