发明名称 Test Schemes and Apparatus for Passive Interposers
摘要 A probe card includes a plurality of probe pins, and a switch network connected to the plurality of probe pins. The switch network is configured to connect the plurality of probe pins in a first pattern, and reconnect the plurality of probe pins in a second pattern different from the first pattern.
申请公布号 US2013015872(A1) 申请公布日期 2013.01.17
申请号 US201113184008 申请日期 2011.07.15
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.;LEE YUN-HAN;WANG MILL-JER;CHOU TAN-LI 发明人 LEE YUN-HAN;WANG MILL-JER;CHOU TAN-LI
分类号 G01R1/073;G01R31/20 主分类号 G01R1/073
代理机构 代理人
主权项
地址