发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SUBSTRATE PROCESSING APPARATUS |
摘要 |
To provide a method of manufacturing a semiconductor device, including: forming a thin film different from a silicon oxide film on a substrate by supplying a processing gas into a processing vessel in which the substrate is housed; removing a deposit including the thin film adhered to an inside of the processing vessel by supplying a fluorine-containing gas into the processing vessel after executing forming the thin film prescribed number of times; and forming a silicon oxide film having a prescribed film thickness on the inside of the processing vessel by alternately supplying a silicon-containing gas, and an oxygen-containing gas and a hydrogen-containing gas into the heated processing vessel in which a pressure is set to be less than an atmospheric pressure after removing the deposit.
|
申请公布号 |
US2013017685(A1) |
申请公布日期 |
2013.01.17 |
申请号 |
US201113582861 |
申请日期 |
2011.02.18 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC.;AKAE NAONORI;MURAKAMI KOTARO;HIROSE YOSHIRO;KAMEDA KENJI |
发明人 |
AKAE NAONORI;MURAKAMI KOTARO;HIROSE YOSHIRO;KAMEDA KENJI |
分类号 |
H01L21/316;H01L21/311 |
主分类号 |
H01L21/316 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|