发明名称
摘要 <p>A semiconductor device includes a plurality of electrode layers provided at designated positions of a semiconductor substrate, an organic insulation film formed on the semiconductor substrate by selectively exposing designated areas of the electrode layers, and projection electrodes for outside connection, the projection electrodes being formed on the designated areas of the electrode layers. Thickness of the organic insulation film situated in the vicinity of the periphery of the projection electrodes is greater than thickness of the organic insulation film situated between the projection electrodes.</p>
申请公布号 JP5118300(B2) 申请公布日期 2013.01.16
申请号 JP20050367210 申请日期 2005.12.20
申请人 发明人
分类号 H01L21/60;H01L21/3065;H01L21/3205;H01L21/768;H01L23/522 主分类号 H01L21/60
代理机构 代理人
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