| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a method and an apparatus for inspecting a light-emitting element, which can improve the inspection accuracy, as well. <P>SOLUTION: A method for inspecting a defect of a light-emitting element 10 includes the steps of measuring a light output of a light-emitting element while injecting a current into the light-emitting element; setting a drive current according to an injected current and a measured light output; measuring a light output, while injecting the set drive current into the light-emitting element in a forward direction; and determining whether the light-emitting element has a defect, according to the light output measured at the former step. <P>COPYRIGHT: (C)2008,JPO&INPIT</p> |
