发明名称 METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
摘要 A manufacturing method of a semiconductor device is provided to cure the dangling bond of the gate insulation pattern by thermal-treating the gate structure including the gate insulation pattern. A manufacturing method of a semiconductor device comprises a step for forming a gate structure(110) on a substrate(100); a step for performing a thermal process on the gate structure; and a step for forming a metal wiring on the top of the substrate. The substrate comprises the silicon. The gate structure is formed by successively laminating a gate insulation pattern(112), one or more gate electrode(114) and a gate mask(116). The gate insulation pattern comprises the silicon oxide. The thermal process is performed under the gas atmosphere including the hydrogen. The metal wiring is made of copper.
申请公布号 KR20090002609(A) 申请公布日期 2009.01.09
申请号 KR20070066111 申请日期 2007.07.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HONG, JONG WON;CHOI, GIL HEYUN;LEE, JONG MYEONG;SEONG, GEUM JUNG
分类号 H01L21/28;H01L21/31 主分类号 H01L21/28
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