发明名称 EDDY CURRENT PROBE
摘要 PURPOSE: An eddy current probe is provided to set an eddy current inspecting direction according to a defect direction and to vertically place the eddy current probe on a geometrical defect surface, thereby improving the capacity and the reliability of an inspection. CONSTITUTION: An eddy current probe comprises a body unit(100) and a supporter(200). A cylindrical internal space is formed in the inside of the body unit. The probe composed of differential coils is protruded in the front surface of the supporter and mounted to be rotated around the body unit. An attachable/detachable probe tip(300) is arranged in the front side of the supporter. A through-hole(301) is formed in the central part of the probe tip in order that the probe can be inserted and protruded to the outside.
申请公布号 KR20130006006(A) 申请公布日期 2013.01.16
申请号 KR20110067775 申请日期 2011.07.08
申请人 KOREA PLANT SERVICE & ENGINEERING CO., LTD. 发明人 PARK, SANG YEOL;KIM, DUK NAM;HA, TAE GU;SHIN, KI BO
分类号 G01N27/90 主分类号 G01N27/90
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