首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
LIGHT EMITTING DEVICE AND FABRICATION METHOD THEREOF
摘要
申请公布号
KR20090046210(A)
申请公布日期
2009.05.11
申请号
KR20070112216
申请日期
2007.11.05
申请人
LG INNOTEK CO., LTD.
发明人
HAN, JAE CHEON
分类号
H01L21/265;H01L33/48
主分类号
H01L21/265
代理机构
代理人
主权项
地址
您可能感兴趣的专利
CIRCUIT DIAGRAM DRAWING METHOD, ITS DEVICE AND MEDIUM STORING CIRCUIT DIAGRAM DRAWING PROGRAM
DEVICE AND METHOD FOR SOFTWARE BREAKPOINTS IMPLEMENTATION VIA SPECIALLY MANED FUNCTION
COMPUTER SYSTEM
STRUCTURE FOR NONLINEAR DYNAMIC CHARACTERISTIC MODEL, AND ITS MODEL PARAMETER ESTIMATING AND CALCULATING MEANS
ELECTROPHOTOGRAPHIC IMAGE RECEIVING SHEET
ELECTROPHOTOGRAPHIC IMAGE RECEIVING SHEET
SUBSTRATE FOR DIAZO COPY MATERIAL AND DIAZO COPY MATERIAL AND METHOD USING THE SAME
SILVER HALIDE PHOTOGRAPHIC EMULSION AND SILVER HALIDE PHOTOSENSITIVE MATERIAL
PROJECTOR
IMAGE READER
OPTICAL WRITING UNIT AND IMAGE FORMING APPARATUS
SPECTACLES AND SPECTACLE FRAME
OPTICAL SCANNER
FIBER ARRAY MODULE PROVIDED WITH PLANAR BASE AND MANUFACTURING METHOD THEREOF
JITTER METER
PROBE AND PROBE MANUFACTURING METHOD
PLATE WAVE ULTRASONIC FLAW DETECTION METHOD AND APPARATUS
HIGH-SPEED PULSE HIGH-SPEED TIME RESPONSE MEASURING METHOD AND APPARATUS
METHOD FOR ANALYZING MATERIAL IN MICROCAPSULE BY TRANSMISSION ELECTRON MICROSCOPE
OPTICAL DEVICE, SPECIMEN MOUNTING COMPONENT, MEASURING METHOD, ANALYTICAL SYSTEM, PERSON COLLATION METHOD AND ALLERGY AND SIDE-EFFECT INSPECTION METHOD