| 摘要 |
A semiconductor device including a plurality of sensor units and a plurality of storage units, the device comprising a controller which in a normal mode, sets first control information based on outputs from the plurality of sensor units, stores the first control information in the plurality of storage units, and accumulates charges in each of the plurality of sensor units up to a reference defined in the corresponding first control information, and in a test mode, stores second control information for tests determined in advance in the plurality of storage units, accumulates charges in each of the plurality of sensor units up to a reference defined in the corresponding second control information, and tests the plurality of sensor units based on the amounts of charges accumulated in the plurality of sensor units. |
