发明名称 Alignment system
摘要 An apparatus for determining alignment of a first subsystem relative to a second subsystem. The apparatus includes a first antenna system for simultaneously transmitting a delta pattern radiation beam at a first frequency and a sum pattern radiation beam at a second frequency. The apparatus also includes a second antenna system for receiving the delta pattern radiation beam at the first frequency and the sum pattern radiation beam at the second frequency. The apparatus also includes a processor to process the received delta pattern radiation beam and sum pattern radiation beam to determine if a predetermined alignment criterion between the first antenna system and the second antenna system is satisfied.
申请公布号 US8354958(B2) 申请公布日期 2013.01.15
申请号 US20100951359 申请日期 2010.11.22
申请人 RAYTHEON COMPANY;SHOWS GILBERT M.;KIM JACOB 发明人 SHOWS GILBERT M.;KIM JACOB
分类号 H01Q3/00 主分类号 H01Q3/00
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