发明名称 Apparatus and method for testing and debugging an integrated circuit
摘要 A system including a frame capture module, a serializer, and a deserializer. The frame capture module is configured to receive, from a device under test, data corresponding to test results, and package the data into first data frames. The serializer is configured serialize the first data frames to form serial messages that include serialized data. The serializer includes i) a first serial link configured to output the serial messages according to a first clock domain, and ii) a second serial link configured to output the serial messages according to a second clock domain. The deserializer is configured to deserialize the serial messages received on the first serial link and the second serial link to form second data frames.
申请公布号 US8356223(B1) 申请公布日期 2013.01.15
申请号 US201213446627 申请日期 2012.04.13
申请人 MARVELL INTERNATIONAL LTD.;AZIMI SAEED;HO SON;SMATHERS DANIEL 发明人 AZIMI SAEED;HO SON;SMATHERS DANIEL
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
主权项
地址