发明名称 VARIABLE DELAY CIRCUIT, RECORDING MEDIA OF MACRO CELL DATA, LOGIC VERIFYING METHOD, TESTING METHOD, AND ELECTRONIC DEVICE
摘要 There is provided a variable delay circuit to be implemented in an integrated circuit, the variable delay circuit including: a variable delay assigning section that assigns a variable time delay to an input signal in an actual operation of the integrated circuit, the variable time delay being varied within a predetermined range in accordance with a time delay inherent in an implementation level; and a verification delay assigning section that assigns a predetermined fixed time delay to the input signal in low-speed logic verification and/or in a low-speed selection test of the integrated circuit. For example, the time delay assigned by the verification delay assigning section is larger than a maximum value of the time delay assigned by the variable delay assigning section.
申请公布号 KR101220137(B1) 申请公布日期 2013.01.11
申请号 KR20077006993 申请日期 2005.08.26
申请人 发明人
分类号 G11C8/00;G11C29/00 主分类号 G11C8/00
代理机构 代理人
主权项
地址