发明名称 CIRCUIT, BIASING SCHEME AND FABRICATION METHOD FOR DIODE ACCESSED CROSS-POINT RESISTIVE MEMORY ARRAY
摘要 Methods, systems, structures and arrays are disclosed, such as a resistive memory array which includes access devices, for example, back-to-back Zener diodes, that only allow current to pass through a coupled resistive memory cell when a voltage drop applied to the access device is greater than a critical voltage. The array may be biased to reduce standby currents and improve delay times between programming and read operations.
申请公布号 US2013011992(A1) 申请公布日期 2013.01.10
申请号 US201213614513 申请日期 2012.09.13
申请人 MICRON TECHNOLOGY, INC.;LIU JUN;PORTER DAVID 发明人 LIU JUN;PORTER DAVID
分类号 H01L21/02 主分类号 H01L21/02
代理机构 代理人
主权项
地址