发明名称 WIRING BOARD AND INSPECTION METHOD USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a wiring board for wafer inspection capable of excellently discharging binder decomposition gas to the outside of a substrate and stably supplying electricity to conductor wires arranged on the surface of the substrate. <P>SOLUTION: The wiring board includes: a laminate 5 including an upper surface and a lower surface having a center area 5a and a peripheral edge area 5b; and a plurality of input/output terminals 9 arranged on the peripheral edge area 5b of the lower surface of the laminate 5. In a plane perspective view, the laminate 5 includes hole parts 19 located on the center area 5a, opened to the lower surface and reaching the midstream of a plurality of ceramic layers 3 and a hollow part 21 located on the inside of the laminate so as to be superposed to the peripheral edge area 5b. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013007581(A) 申请公布日期 2013.01.10
申请号 JP20110138769 申请日期 2011.06.22
申请人 KYOCERA CORP 发明人 MIYAWAKI KIYOSHIGE
分类号 G01R1/073;H01L21/66 主分类号 G01R1/073
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